A Fast Form Approach to Measuring Technology Acceptance and...

MIS Quarterly 2008 / 12 Vol. 32; Iss. 4

A Fast Form Approach to Measuring Technology Acceptance and Other Constructs

Wynne W. Chin, Norman Johnson and Andrew Schwarz
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Volume:
32
Language:
english
Journal:
MIS Quarterly
DOI:
10.2307/25148867
Date:
December, 2008
File:
PDF, 2.08 MB
english, 2008
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