Impact of Trapping Effects on the Recovery Time of GaN Based Low Noise Amplifiers
Axelsson, Olle, Billstrom, Niklas, Rorsman, Niklas, Thorsell, MattiasVolume:
26
Language:
english
Journal:
IEEE Microwave and Wireless Components Letters
DOI:
10.1109/LMWC.2015.2505641
Date:
January, 2016
File:
PDF, 547 KB
english, 2016