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[IEEE 2015 12th China International Forum on Solid State Lighting (SSLCHINA) - Shenzhen, China (2015.11.2-2015.11.4)] 2015 12th China International Forum on Solid State Lighting (SSLCHINA) - Towards high reliability GaN LEDs: Understanding the physical origin of gradual and catastrophic failure
Meneghini, Matteo, De Santi, Carlo, Buffolo, Matteo, Munaretto, Andrea, Meneghesso, Gaudenzio, Zanoni, EnricoYear:
2015
Language:
english
DOI:
10.1109/SSLCHINA.2015.7360690
File:
PDF, 657 KB
english, 2015