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[IEEE 2015 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Austin, TX, USA (2015.11.2-2015.11.6)] 2015 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Modern big data analytics for “Old-fashioned” semiconductor industry applications
Zhu, Yada, Xiong, JinjunYear:
2015
Language:
english
DOI:
10.1109/ICCAD.2015.7372649
File:
PDF, 844 KB
english, 2015