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[IEEE International Test Conference 2004 - Charlotte, NC, USA (26-28 Oct. 2004)] 2004 International Conferce on Test - Logic BIST with scan chain segmentation
Liyang Lai,, Patel, J.H., Rinderknecht, T., Wu-Tung Cheng,Year:
2004
Language:
english
DOI:
10.1109/TEST.2004.1386937
File:
PDF, 654 KB
english, 2004