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The Use of Nanoscaled Al Mid-Layer for Enhancing the Electrical Conductivity of ZnO
Wu, Wan-Yu, Lin, Chia-Kang, Ting, Jyh-MingVolume:
10
Language:
english
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2010.1932
Date:
August, 2010
File:
PDF, 247 KB
english, 2010