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CCD based high resolution non-destructive testing system for industrial applications
V.V. Nagarkar, S. Vasile, P. Gothoskar, J.S. Gordon, T.K. GuptaVolume:
48
Year:
1997
Language:
english
Pages:
7
DOI:
10.1016/s0969-8043(97)00141-3
File:
PDF, 664 KB
english, 1997