Cryogenic detectors below 100 mK for X-ray measurements in metrology
C. Bobin, E. Leblanc, J. Bouchard, N. Coron, P. Cassette, J. Leblanc, P. de Marcillac, J. PlagnardVolume:
52
Year:
2000
Language:
english
Pages:
4
DOI:
10.1016/s0969-8043(99)00186-4
File:
PDF, 127 KB
english, 2000