![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE SPIE/COS Photonics Asia - Beijing, China (Thursday 9 October 2014)] Optical Metrology and Inspection for Industrial Applications III - Research on high-accuracy two-dimensional digital image correlation hardware measurement systems used in the engineering practice
Han, Sen, Yoshizawa, Toru, Zhang, Song, Chen, Guang, Ding, Keqin, Feng, QiboVolume:
9276
Year:
2014
Language:
english
DOI:
10.1117/12.2073724
File:
PDF, 385 KB
english, 2014