Depth-selective 2D-ACAR studies on low-k dielectric thin films
S.W.H. Eijt, A. van Veen, C.V. Falub, R.Escobar Galindo, H. Schut, P.E. Mijnarends, F.K. de Theije, A.R. BalkenendeVolume:
68
Year:
2003
Language:
english
Pages:
6
DOI:
10.1016/s0969-806x(03)00184-1
File:
PDF, 321 KB
english, 2003