[IEEE 2015 Days on Diffraction (DD) - St.Petersburg, Russia (2015.5.25-2015.5.29)] 2015 Days on Diffraction (DD) - Wideband computationally-effective worst-case model of twisted pair radiation
Arlou, Yauheni Y., Tsyanenka, Dzmitry A., Sinkevich, Eugene V.Year:
2015
Language:
english
DOI:
10.1109/DD.2015.7354824
File:
PDF, 1.23 MB
english, 2015