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SPIE Proceedings [SPIE International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013) - Singapore, Singapore (Tuesday 9 April 2013)] International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013) - Carrier frequency removal in phase measuring deflectometry with non-telecentric imaging
Yue, Huimin, Quan, Chenggen, Qian, Kemao, Wu, Yuxiang, Song, Lei, Asundi, Anand, Zhao, Biyu, Ou, Zhonghua, Liu, YongVolume:
8769
Year:
2013
Language:
english
DOI:
10.1117/12.2018711
File:
PDF, 1.30 MB
english, 2013