Evaluation of thermal performance of packaged GaN HEMT...

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Applied Thermal Engineering 2015 / 12

Evaluation of thermal performance of packaged GaN HEMT cascode power switch by transient thermal testing

Chen, Szu-Hao, Chou, Po-Chien, Cheng, Stone
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Language:
english
Journal:
Applied Thermal Engineering
DOI:
10.1016/j.applthermaleng.2015.12.110
Date:
December, 2015
File:
PDF, 1.26 MB
english, 2015
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