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Characterisation of embedded nano-precipitates by X-ray...

Characterisation of embedded nano-precipitates by X-ray diffraction imaging and small-angle X-ray scattering

Pelliccia, Daniele, Nikulin, Andrei Y., Kirby, Nigel, Hester, James
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Volume:
11
Year:
2014
Language:
english
Journal:
International Journal of Nanotechnology
DOI:
10.1504/IJNT.2014.060576
File:
PDF, 1.85 MB
english, 2014
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