Characterisation of embedded nano-precipitates by X-ray diffraction imaging and small-angle X-ray scattering
Pelliccia, Daniele, Nikulin, Andrei Y., Kirby, Nigel, Hester, JamesVolume:
11
Year:
2014
Language:
english
Journal:
International Journal of Nanotechnology
DOI:
10.1504/IJNT.2014.060576
File:
PDF, 1.85 MB
english, 2014