SPIE Proceedings [SPIE Laser Metrology for Precision Management and Inspection in Industry - Florianopolis, Brazil (Thursday 22 February 2001)] Laser Metrology for Precision Measurement and Inspection in Industry - Interferometric method for in-situ characterization of coating industrial processes
Michels, Alexandre F., Horowitz, Flavio, Albertazzi, Jr., ArmandoVolume:
4420
Year:
2001
Language:
english
DOI:
10.1117/12.439216
File:
PDF, 506 KB
english, 2001