![](/img/cover-not-exists.png)
Effect of Ti cap layer thickness on microstructures and magnetic properties of Ti/Ni/Ti films
Shunzhen FENG, Qin XU, Yanhui DONG, Zhichun MA, Jihong Liu, Huiyuan SUNVolume:
28
Year:
2010
Language:
english
Pages:
3
DOI:
10.1016/s1002-0721(10)60278-5
File:
PDF, 482 KB
english, 2010