Characterization and modeling of drain current local...

Solid-State Electronics 2016 / 04 Vol. 118

Characterization and modeling of drain current local variability in 28 and 14nm FDSOI nMOSFETs

Ioannidis, E.G., Haendler, S., Josse, E., Planes, N., Ghibaudo, G.
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Volume:
118
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2016.01.002
Date:
April, 2016
File:
PDF, 10.52 MB
english, 2016
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