![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 29 July 2001)] Engineering Thin Films with Ion Beams, Nanoscale Diagnostics, and Molecular Manufacturing - In-situ biaxial texture analysis of MgO films during growth on amorphous substrates by ion-beam-assisted deposition
Brewer, Rhett, Arendt, Paul N., Groves, James R., Atwater, Harry A., Knystautas, Emile J., Kirk, Wiley P., Browning, ValerieVolume:
4468
Year:
2001
Language:
english
DOI:
10.1117/12.452547
File:
PDF, 382 KB
english, 2001