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Power cycling reliability of power modules: a survey
Durand, Camille, Klingler, Markus, Coutellier, Daniel, Naceur, HakimYear:
2016
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2016.2516044
File:
PDF, 871 KB
english, 2016