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[IEEE 2015 IEEE International Workshop on Information Forensics and Security (WIFS) - Roma, Italy (2015.11.16-2015.11.19)] 2015 IEEE International Workshop on Information Forensics and Security (WIFS) - General-purpose image forensics using patch likelihood under image statistical models
Fan, Wei, Wang, Kai, Cayre, FrancoisYear:
2015
Language:
english
DOI:
10.1109/WIFS.2015.7368606
File:
PDF, 2.23 MB
english, 2015