![](/img/cover-not-exists.png)
[IEEE 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Reno, NV, USA (2015.9.27-2015.10.2)] 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - An electrostatic-discharge-protection solution for Silicon-Carbide MESFET
Phulpin, T., Tremouilles, D., Isoird, K., Tournier, D, Godignon, P., Austin, P.Year:
2015
Language:
english
DOI:
10.1109/eosesd.2015.7314750
File:
PDF, 4.31 MB
english, 2015