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[IEEE 2015 IEEE International Conference on Image Processing (ICIP) - Quebec City, QC, Canada (2015.9.27-2015.9.30)] 2015 IEEE International Conference on Image Processing (ICIP) - Fast image completion method using patch offset statistics
Koppel, Marin, Ben Makhlouf, Mehdi, Muller, Karsen, Wiegand, ThomasYear:
2015
DOI:
10.1109/ICIP.2015.7351110
File:
PDF, 7.27 MB
2015