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IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2015

Read Bitline Sensing and Fast Local Write-Back Techniques in Hierarchical Bitline Architecture for Ultralow-Voltage SRAMs

Wang, Bo, Li, Qi, Kim, Tony Tae-Hyoung
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Year:
2015
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2015.2499441
File:
PDF, 2.83 MB
english, 2015
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