![](/img/cover-not-exists.png)
[IEEE 2014 IEEE 12th International Conference on Solid -State and Integrated Circuit Technology (ICSICT) - Guilin, China (2014.10.28-2014.10.31)] 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Reducing single event upset by lowering the threshold voltage of transistors
Zheng, Zhongshan, Li, Zhentao, Qiao, Ning, Zhao, Kai, Yu, FangYear:
2014
Language:
english
DOI:
10.1109/ICSICT.2014.7021660
File:
PDF, 552 KB
english, 2014