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[IEEE 2015 IEEE 42nd Photovoltaic Specialists Conference (PVSC) - New Orleans, LA, USA (2015.6.14-2015.6.19)] 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC) - A new mc-Si degradation effect called LeTID
Kersten, Friederike, Engelhart, Peter, Ploigt, Hans-Christoph, Stekolnikov, Andrey, Lindner, Thomas, Stenzel, Florian, Bartzsch, Matthias, Szpeth, Andy, Petter, Kai, Heitmann, Johannes, Muller, Jorg WYear:
2015
Language:
english
DOI:
10.1109/PVSC.2015.7355684
File:
PDF, 1.32 MB
english, 2015