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SPIE Proceedings [SPIE International Conference on Optical Metrology - Pultusk Castle, Poland (Wednesday 20 October 1999)] Interferometry '99: Applications - Some ways to improve the recognition of imperfections in large-scale components using shearography
Osten, Wolfgang, Kalms, Michael K., Jueptner, Werner P. O., Jueptner, Werner P. O., Patorski, KrzysztofVolume:
3745
Year:
1999
Language:
english
DOI:
10.1117/12.357785
File:
PDF, 4.82 MB
english, 1999