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Activation Energies for Diffusion of Defects in Silicon: The Role of the Exchange-Correlation Functional
Prof. Dr. Stefan K. Estreicher, Dr. Daniel J. Backlund, Dr. Christian Carbogno, Prof. Dr. Matthias SchefflerVolume:
50
Year:
2011
Language:
english
Pages:
5
DOI:
10.1002/anie.201100733
File:
PDF, 457 KB
english, 2011