Probing weak localization in chemical vapor deposition...

Nanotechnology 2016 / 02 Vol. 27; Iss. 7

Probing weak localization in chemical vapor deposition graphene wide constriction using scanning gate microscopy

Chuang, C, Matsunaga, M, Liu, F-H, Woo, T-P, Aoki, N, Lin, L-H, Wu, B-Y, Ochiai, Y, Liang, C-T
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Volume:
27
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/27/7/075601
Date:
February, 2016
File:
PDF, 962 KB
english, 2016
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