SPIE Proceedings [SPIE Electron Technology Conference 2013...

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SPIE Proceedings [SPIE Electron Technology Conference 2013 - Ryn, Poland (Tuesday 16 April 2013)] Electron Technology Conference 2013 - Electrical characterization of GaN-channel MOSFETs

Jasiński, Jakub, Łukasiak, Lidia, Jakubowski, Andrzej, Kim, Do-Kywn, Kim, Dong-Seok, Hahm, Sung-Ho, Lee, Jung-Hee, Szczepanski, Pawel, Kisiel, Ryszard, Romaniuk, Ryszard S.
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Volume:
8902
Year:
2013
Language:
english
DOI:
10.1117/12.2031288
File:
PDF, 364 KB
english, 2013
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