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[IEEE 2015 17th European Conference on Power Electronics and Applications (EPE '15 ECCE Europe) - Geneva, Switzerland (2015.9.8-2015.9.10)] 2015 17th European Conference on Power Electronics and Applications (EPE'15 ECCE-Europe) - Temperature effects on performance of SiC power transistors (SiC JFET and SiC MOSFET)
Ping, Zhu, Li, Wang, Li-gang, Ruan, Jian-feng, ZhangYear:
2015
Language:
english
DOI:
10.1109/EPE.2015.7309249
File:
PDF, 1.17 MB
english, 2015