[IEEE Proceedings of the 17th International Conference on Pattern Recognition, 2004. ICPR 2004. - Cambridge, UK (2004.08.26-2004.08.26)] Proceedings of the 17th International Conference on Pattern Recognition, 2004. ICPR 2004. - A statistical shape model without using landmarks
Vos, F.M., de Bruin, P.W., Aubel, J.G.M., Streekstra, G.J., Maas, M., van Vliet, L.J., Vossepoel, A.M.Year:
2004
Language:
english
DOI:
10.1109/ICPR.2004.1334628
File:
PDF, 373 KB
english, 2004