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SPIE Proceedings [SPIE SPIE Micro+Nano Materials, Devices, and Applications - Sydney, New South Wales, Australia (Sunday 6 December 2015)] Micro+Nano Materials, Devices, and Systems - Damage monitoring using fiber optic sensors and by analysing electro-mechanical admittance signatures obtained from piezo sensor
Eggleton, Benjamin J., Palomba, Stefano, Maheshwari, Muneesh, Annamdas, Venu Gopal M., Pang, John Hock Lye, Tjin, Swee C., Asundi, Anand K.Volume:
9668
Year:
2015
Language:
english
DOI:
10.1117/12.2202547
File:
PDF, 1.21 MB
english, 2015