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SPIE Proceedings [SPIE International Symposium on Photoelectronic Detection and Imaging: Technology and Applications 2007 - Beijing, China (Sunday 9 September 2007)] International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing - Performance analysis of Brillouin optical time domain reflectometer using Golay complementary sequence
Cheng, Xiao-wei, Li, Yong-qian, Zhou, LiweiVolume:
6624
Year:
2008
Language:
english
DOI:
10.1117/12.791086
File:
PDF, 282 KB
english, 2008