Performances of an 80-200 kV microscope employing a cold-FEG and an aberration-corrected objective lens
Ricolleau, C., Nelayah, J., Oikawa, T., Kohno, Y., Braidy, N., Wang, G., Hue, F., Florea, L., Pierron Bohnes, V., Alloyeau, D.Volume:
62
Language:
english
Journal:
Microscopy
DOI:
10.1093/jmicro/dfs072
Date:
April, 2013
File:
PDF, 11.17 MB
english, 2013