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SPIE Proceedings [SPIE Photonics Fabrication Europe - Brugge, Belgium (Monday 28 October 2002)] Integrated Optical Devices: Fabrication and Testing - Leakage of a guided mode caused by static and light-induced inhomogeneities in channel HTPE-LiNbO3 waveguides
Kostritskii, Sergey M., Korkishko, Yuri N., Fedorov, Vyacheslav A., Alkaev, Alexander N., Kritzak, Vladmir S., Moretti, Paul, Tascu, Sorin, Jacquier, Bernard, Righini, Giancarlo C.Volume:
4944
Year:
2003
Language:
english
DOI:
10.1117/12.470323
File:
PDF, 218 KB
english, 2003