[IEEE 2015 IEEE 22nd International Symposium on the...

  • Main
  • [IEEE 2015 IEEE 22nd International...

[IEEE 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Hsinchu (2015.6.29-2015.7.2)] 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits - On the origin of frequency dependence of single-trap induced degradation in AC NBTI

Dongyuan Mao,, Shaofeng Guo,, Runsheng Wang,, Changze Liu,, Ru Huang,
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2015
Language:
english
DOI:
10.1109/IPFA.2015.7224344
File:
PDF, 314 KB
english, 2015
Conversion to is in progress
Conversion to is failed