SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 9 August 2015)] Polarization Science and Remote Sensing VII - Applying a microfacet model to polarized light scattering measurements of the Earth's surface
Shaw, Joseph A., LeMaster, Daniel A., Kupinski, Meredith, Bradley, Christine, Diner, David, Xu, Feng, Chipman, RussellVolume:
9613
Year:
2015
Language:
english
DOI:
10.1117/12.2188207
File:
PDF, 1016 KB
english, 2015