Regressing sample quantiles to perform nonparametric capability analysis
Salazar-Alvarez, María I., Temblador-Pérez, Carmen, Conover, William J., Tercero-Gómez, Víctor G., Cordero-Franco, Alvaro E., Beruvides, Mario G.Volume:
86
Language:
english
Journal:
The International Journal of Advanced Manufacturing Technology
DOI:
10.1007/s00170-015-8285-6
Date:
September, 2016
File:
PDF, 526 KB
english, 2016