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[IEEE 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - Amherst, MA, USA (2015.10.12-2015.10.14)] 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - A method to protect Bloom filters from soft errors
Reviriego, Pedro, Pontarelli, Salvatore, Maestro, Juan Antonio, Ottavi, MarcoYear:
2015
Language:
english
DOI:
10.1109/DFT.2015.7315140
File:
PDF, 189 KB
english, 2015