Ultra-Fast Erase Method of SONOS Flash Memory by...

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IEEE Electron Device Letters 2015

Ultra-Fast Erase Method of SONOS Flash Memory by Instantaneous Thermal Excitation

Ahn, Dae-Chul, Seol, Myeong-Lok, Hur, Jae, Moon, Dong-Il, Lee, Byung-Hyun, Han, Jin-Woo, Park, Jun-Young, Jeon, Seung-Bae, Choi, Yang-Kyu
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Year:
2015
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2015.2512280
File:
PDF, 469 KB
english, 2015
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