[IEEE 2015 38th International Convention on Information and...

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[IEEE 2015 38th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO) - Opatija, Croatia (2015.5.25-2015.5.29)] 2015 38th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO) - GA-ANFIS expert system prototype for detection of tar content in the manufacturing process

Fazlic, Lejla Begic, Avdagic, Zikrija, Besic, Ingmar
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Year:
2015
Language:
english
DOI:
10.1109/MIPRO.2015.7160457
File:
PDF, 234 KB
english, 2015
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