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Effects of the Variation of Ferroelectric Properties on Negative Capacitance FET Characteristics
Lin, Cheng-I, Khan, Asif Islam, Salahuddin, Sayeef, Hu, ChenmingYear:
2016
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2016.2514783
File:
PDF, 678 KB
english, 2016