SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, CA (Sunday 26 August 2007)] Remote Sensing and Modeling of Ecosystems for Sustainability IV - Sensitivity analysis of MODIS band-to-band registration characterization and its impact on the science data products
Xie, Yong, Xiong, Xiaoxiong, Qu, John J., Che, Nianzeng, Wang, Lingli, Gao, Wei, Ustin, Susan L.Volume:
6679
Year:
2007
Language:
english
DOI:
10.1117/12.735398
File:
PDF, 423 KB
english, 2007