IV-Characteristics Measurement Error Resulting from Long...

Advanced Materials Research 2015 / 1 Vol. 1083

IV-Characteristics Measurement Error Resulting from Long Cables for Irradiated Bipolar Junction Transistors

Petrosyants, Konstantin O., Kharitonov, Igor A., Sambursky, Lev M., Kozhukhov, Maxim V.
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Volume:
1083
Language:
english
Journal:
Advanced Materials Research
DOI:
10.4028/www.scientific.net/AMR.1083.185
Date:
January, 2015
File:
PDF, 1.01 MB
english, 2015
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