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[IEEE 2004 IEEE International Reliability Physics Symposium. - Phoenix, AZ, USA (25-29 April 2004)] 2004 IEEE International Reliability Physics Symposium. Proceedings - Transient-LU failure analysis of the ICs, methods of investigation and computer aided simulations

Domanski, K., Bargstadt-Franke, S., Stadler, W., Streibl, M., Steckert, G., Bala, W.
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Year:
2004
Language:
english
DOI:
10.1109/RELPHY.2004.1315354
File:
PDF, 434 KB
english, 2004
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