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SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology (OIT2011) - Beijing, China (Sunday 6 November 2011)] 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - Research on the field on-line automatic detection of infrared thermal imager MRTD based on infrared image's gray level difference
Chen, Zhibin, Liu, Yuxiang, Xue, Mingxi, Liu, Baohua, Hou, ZhangyaVolume:
8201
Year:
2012
Language:
english
DOI:
10.1117/12.904665
File:
PDF, 251 KB
english, 2012