1-Grad total dose evaluation of 65 nm CMOS technology for the HL-LHC upgrades
Menouni, M., Barbero, M., Bompard, F., Bonacini, S., Fougeron, D., Gaglione, R., Rozanov, A., Valerio, P., Wang, A.Volume:
10
Language:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/10/05/C05009
Date:
May, 2015
File:
PDF, 5.44 MB
english, 2015