![](/img/cover-not-exists.png)
[IEEE 2015 IEEE 24th International Symposium on Industrial Electronics (ISIE) - Buzios, Rio de Janeiro, Brazil (2015.6.3-2015.6.5)] 2015 IEEE 24th International Symposium on Industrial Electronics (ISIE) - Automated PCB inspection in small series production based on SIFT algorithm
Szymanski, Charbel, Stemmer, Marcelo RicardoYear:
2015
Language:
english
DOI:
10.1109/ISIE.2015.7281535
File:
PDF, 476 KB
english, 2015