A 16 nm All-Digital Auto-Calibrating Adaptive Clock...

IEEE Journal of Solid-State Circuits 2016 / 1 Vol. 51; Iss. 1

A 16 nm All-Digital Auto-Calibrating Adaptive Clock Distribution for Supply Voltage Droop Tolerance Across a Wide Operating Range

Bowman, Keith A., Raina, Sarthak, Bridges, J. Todd, Yingling, Daniel J., Nguyen, Hoan H., Appel, Brad R., Kolla, Yesh N., Jeong, Jihoon, Atallah, Francois I., Hansquine, David W.
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Volume:
51
Language:
english
Journal:
IEEE Journal of Solid-State Circuits
DOI:
10.1109/JSSC.2015.2473655
Date:
January, 2016
File:
PDF, 2.47 MB
english, 2016
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