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Evaluation of 1.5-T Cell Flash Memory Total Ionizing Dose Response
Clark, Lawrence T., Holbert, Keith E., Adams, James W., Navale, Harshad, Anderson, Blake C.Volume:
62
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2015.2488539
Date:
December, 2015
File:
PDF, 1.18 MB
english, 2015